Ion-tof公司

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August undefined, 2024

WebZ-Gap MCP Microchannel Plate Detectors are available with 18mm, 25mm or 40mm Microchannel Plates. Note: Z-Gap detectors cannot be used to detect negative ions or electrons. Jordan TOF Products, Inc. 990 Golden Gate Terrace Grass Valley, CA 95945 Phone: 530-272-4580 E-mail: [email protected] WebUltra-high transmission for optimized molecular sensitivity and monolayer analysis High speed (> 8 kHz) TOF-SIMS (MS 1) and tandem MS (MS 2) imaging High resolution (< 100 nm) TOF-SIMS (MS 1) and tandem MS …

IONTOF - TOF-SIMS (time of flight secondary ion mass …

WebAbout IONTOF GmbH: IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry … Web我司作为德国ion-tof公司的中国总代理，成立于2012年。主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。公司成员来自北京大学、中科院物理所等一流院校 … sbi mini statement by sms

关于我们-飞行时间二次离子质谱 (TOF-SIMS) 德国IONTOF

Web25 mei 2024 · IONTOF GmbH 626 followers on LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments ... WebThe ioniTOF mass analyzer is designed as a modular and flexible TOF-MS platform that allows you to choose the mass resolving power you need and also upgrade to higher resolution if you feel the need at a later stage of your experiments. The ioniTOF is available with mass resolutions ranging from 500 to even more than 10,000. http://www.iontof.com.cn/ should the prostate be soft firm or hard

Evaluation of matrix effects on TOF-SIMS data of leu-enkephalin …

WebThe IONICON ioniAPi-TOF is a modular and robust Time-of-Flight mass spectrometer designed for the detection and mass analysis of ions generated at atmospheric pressure. … WebAn ion source (either pulsed or continuous) is used for lab-related TOF experiments, but not needed for TOF analyzers used in space, where the sun or planetary ionospheres … should the radiator fan always be onWeb19 jan. 2024 · Specifically with a huge cluster ion beam such as Ar cluster ions, TOF-SIMS provides organic depth profiles in detail, which is powerful not only for organic and polymer science fields but also for biological fields. However, secondary ionization by TOF-SIMS is often a problem in quantitative analysis due to the matrix effects 1–14 1. R. G. should the postal service be privatized

"WebION-TOF公司创建于1989年，是专门研究和生产飞行时间二次离子质谱仪器(TOF-SIMS)的高科技公司。其创始人贝宁豪文(Beninghoven)教授是静态二次离子质谱的奠基人，创建 … " - Ion-tof公司

Ion-tof公司

PHI nanoTOF II TOF-SIMS Surface Analysis Instrument

Web2.3. ToF-SIMS 和Rf-GDOES深度剖析 ToF-SIMS 和Rf-GDOES 设备分别是德国ION-ToF 公司的ION-ToF SIMS 5和法国Horiba 公司的 GD-Profiler2。ToF-SIMS 深度剖析的工作参数为：2keV O 2 +溅射离子，30keVBi+为二次离子源，束流强 Web刘看山知乎指南知乎协议知乎隐私保护指引应用工作申请开通知乎机构号侵权举报网上有害信息举报专区京 icp 证 110745 号京 icp 备 13052560 号 - 1 京公网安备 …

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WebTime-of-Flight Secondary Ion Mass Spectrometry Summary Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. WebThe positive and negative spectra for each sample were acquired using TOF-SIMS.5 (ION-TOF GmbH, Münster) with 60 keV Bi 3 2+, current of 0.2 pA, as a primary ion beam and a 10 keV Ar 1000 +, current of 2 nA, as a sputtering beam. 16 The analysis area was 100 × 100 μm 2, with a pixel density of 128 × 128, and the sputtering area was 500 × ...

WebUniversity of Texas at Austin WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ...

Web为了进一步简化谱图数据处理，IONTOF 为 M6 提供了各种工具，例如质谱图库，完全集成的多元统计分析（MVSA）软件包，以及强大性能的 Q ExactiveTM 功能扩展。 M6 TOF … Web3 jul. 2012 · 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理，成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。. “以物理学、材料学、国际贸易等专业背景打造的 ...

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http://rmjordan.com/ should the press be humanWeb13 apr. 2024 · 南京某科技公司将Vzense RGB-D ToF相机集成在军事考核评分系统中，用于检测士兵体能达标状况。应用案例六. 牛羊数量检测. Vzense ToF相机在畜牧业养殖方 … should the reference page be separateWeb22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis should the reference page be bolded should the rain jackets be looseWeb• TOF-SIMS: “ION-TOF IV” instrument. Ga-LMIS analytical source, 25 keV, high current bunched mode (typically m/∆m = 8000), analysis area 60×60 µm2. Sputter source Ar-EI, 3 keV, sputter area 200×200 µm2. Pulsed electron source for neutralisa-tion, 4×10–6 mbar argon flooding for sensitivity enhancement. should the references be justifiedWebIONTOFジャパン株式会社 Your NEW Partner for Surface Analysis 2024年4月始動！ M6 - SIMS technology one step ahead M6 は、IONTOF社が提案する最新世代の TOF-SIMS です。最新のイオン銃およびアナライザーを搭載し、分析性能、操作性が大きく向上しました。あらゆる分野の分析ニーズに対応し、産業および学術研究に理想的な製品です。 … should the ravens fire john harbaughWeb29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … The basic instrument is equipped with a reflectron TOF analyser giving high … Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … Service - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... sbi mini statement missed call number